Toimittaja: Hitachi High-Technologies GmbH Stockholm Filial
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2021-07-07Broad Ion Beam Mill (University of Turku)
Broad argon ion beam mill suitable for preparing cross-sections and surface polishing of samples of various nature for scanning electron microscopy imaging (SEM), including elemental and structural analysis, such as X-ray spectrometry (EDS/WDS) and electron backscatter diffraction analysis (EBSD).
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