Viimeaikaiset hankinnat, joissa toimittaja on mainittu Finfocus Oy
2022-10-07A combined focused-ion beam / scanning electron microscope FIB-SEM (VTT Technical Research Centre of Finland Ltd)
The object of the tender process is a combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber (later also “Equipment”).
A combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ …
Näytä hankinnat » Mainitut toimittajat:Finfocus Oy