A combined focused-ion beam / scanning electron microscope FIB-SEM

VTT Technical Research Centre of Finland Ltd

The object of the tender process is a combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber (later also “Equipment”).
A combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber. The electron beam should operate flexile from 0.5 kV to 30 kV with reasonable beam currents for analyses. The ion beam system should operate similarly in a flexible manner up to 30 kV and provide adequate resolution and milling rates for the materials, which are mainly steels. Automated ion milling software should be included with possibilities to perform 3D examinations and to pre-fabricate specimens for high-end techniques such as Atom Probe Tomography (APT) and Transmission Electron Microscopy (TEM). The FIB-SEM system should provide fast high-quality detectors for the techniques that are mostly applied: Energy Dispersive X-ray Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), and Electron Channeling Contrast Imaging (ECCI) investigations.
The technical specification of the equipment and the tender process to be supplied is discussed in more detail in the invitation to tender documents.

Määräaika

Tarjousten vastaanottamisen määräaika oli 2022-11-11. Hankinta julkaistiin 2022-10-07.

Toimittajat

Seuraavat toimittajat mainitaan hankintapäätöksissä tai muissa hankinta-asiakirjoissa:

Kuka? Mitä? Missä?
Hankintojen historia
Päivämäärä Asiakirja
2022-10-07 hankintailmoitus
2023-02-23 Ilmoitus tehdystä sopimuksesta
hankintailmoitus (2022-10-07)
Kohde
Hankinnan laajuus
Otsikko: Elektronimikroskoopit
Viitenumero: Reg. No 49/206/2022
Lyhyt kuvaus:
The object of the tender process is a combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber (later also “Equipment”). A combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber. The electron beam should operate flexile from 0.5 kV to 30 kV with reasonable beam currents for analyses. The ion beam system should operate similarly in a flexible manner up to 30 kV and provide adequate resolution and milling rates for the materials, which are mainly steels. Automated ion milling software should be included with possibilities to perform 3D examinations and to pre-fabricate specimens for high-end techniques such as Atom Probe Tomography (APT) and Transmission Electron Microscopy (TEM). The FIB-SEM system should provide fast high-quality detectors for the techniques that are mostly applied: Energy Dispersive X-ray Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), and Electron Channeling Contrast Imaging (ECCI) investigations. The technical specification of the equipment and the tender process to be supplied is discussed in more detail in the invitation to tender documents.
Näytä lisää
Ilmoituksen metatiedot
Alkukieli: englanti 🗣️
Asiakirjatyyppi: hankintailmoitus
Sopimuksen luonne: Tavarat
Asetus: Euroopan unioni ja WTO-maat
Yhteinen hankintanimikkeistö (CPV)
Koodi: Elektronimikroskoopit 📦
Suorituspaikka
NUTS-alue: Manner-Suomi 🏙️

Menettely
Menettelyn tyyppi: Avoin menettely
Tarjouksen tyyppi: Tarjous koskee kaikkia eriä
Myöntämisperusteet
Kokonaistaloudellisesti edullisin tarjous

Hankintaviranomainen
Tunnistetiedot
Maa: Suomi 🇫🇮
Hankintaviranomaisen tyyppi: Julkisoikeudellinen yhteisö
Hankintaviranomaisen nimi: VTT Technical Research Centre of Finland Ltd
Postiosoite: P.O. Box 1000, VTT
Postinumero: 02044
Postitoimipaikka: Espoo
Yhteystiedot
Internetosoite: https://www.vttresearch.com/en 🌏
Sähköposti: kilpailutus@vtt.fi 📧
Puhelin: +358 20722111 📞
Asiakirjojen URL-osoite: https://tarjouspalvelu.fi/vtt?id=416000&tpk=69604406-8b41-43ab-9808-93943c346699 🌏
Osallistumisen URL-osoite: https://tarjouspalvelu.fi/vtt?id=416000&tpk=69604406-8b41-43ab-9808-93943c346699 🌏

Viite
Päivämäärät
Lähetyspäivä: 2022-10-07 📅
Tarjousten jättämisen määräaika: 2022-11-11 📅
Julkaisupäivä: 2022-10-12 📅
Tunnisteet
Ilmoituksen numero: 2022/S 197-558521
EUVL-S-numero: 197
Lisätietoja
The given date is preliminary. VTT reserves the right to change the scheduled date and time. The opening of tenders shall not be a public event.

Kohde
Hankinnan laajuus
Lyhyt kuvaus:
The object of the tender process is a combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber (later also “Equipment”).
Näytä lisää
A combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber. The electron beam should operate flexile from 0.5 kV to 30 kV with reasonable beam currents for analyses. The ion beam system should operate similarly in a flexible manner up to 30 kV and provide adequate resolution and milling rates for the materials, which are mainly steels. Automated ion milling software should be included with possibilities to perform 3D examinations and to pre-fabricate specimens for high-end techniques such as Atom Probe Tomography (APT) and Transmission Electron Microscopy (TEM). The FIB-SEM system should provide fast high-quality detectors for the techniques that are mostly applied: Energy Dispersive X-ray Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), and Electron Channeling Contrast Imaging (ECCI) investigations.
Näytä lisää
The technical specification of the equipment and the tender process to be supplied is discussed in more detail in the invitation to tender documents.
Kesto: 12 kuukautta

Oikeudelliset, taloudelliset, rahoitukselliset ja tekniset tiedot
Osallistumisehdot
Kelpoisuus harjoittaa ammattitoimintaa: As stated in the invitation to tender documents.
Taloudellinen ja rahoituksellinen asema: Selection criteria as stated in the invitation to tender documents
Tekninen ja ammatillinen pätevyys: Selection criteria as stated in the invitation to tender documents
Sopimuksen toteuttaminen
Sopimuksen täytäntöönpanoehdot: As stated in the invitation to tender documents.

Menettely
Oikeusperusta: 32014L0024
Tarjousten vastaanottoaika: 12:00
Kielet, joilla tarjoukset tai osallistumishakemukset voidaan jättää: englanti 🗣️
Tarjouksen voimassaoloaika: 2023-02-28 📅
Tarjousten avauspäivä: 2022-11-11 📅
Tarjousten avausaika: 12:30
Lisätietoja:
The given date is preliminary. VTT reserves the right to change the scheduled date and time.
The opening of tenders shall not be a public event.

Hankintaviranomainen
Tunnistetiedot
Kansallinen rekisterinumero: 2647375-4
Yhteystiedot
Asiakirjojen URL-osoite: https://tarjouspalvelu.fi/vtt?id=416000&tpk=69604406-8b41-43ab-9808-93943c346699 🌏

Viite
Lisätietoja
This notice has links and/or attachments listed in https://www.hankintailmoitukset.fi/en/public/procurement/76350/notice/110136

Täydentävät tiedot
Arvostelurunko
Nimi: Markkinaoikeus
Postiosoite: Sörnäistenkatu 1
Postitoimipaikka: Helsinki
Postinumero: 00580
Maa: Suomi 🇫🇮
Puhelin: +358 295643300 📞
Sähköposti: markkinaoikeus@oikeus.fi 📧
Internetosoite: http://www.oikeus.fi/markkinaoikeus 🌏
Lähde: OJS 2022/S 197-558521 (2022-10-07)
Ilmoitus tehdystä sopimuksesta (2023-02-23)
Kohde
Hankinnan laajuus
Lyhyt kuvaus:
The object of the tender process was a combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber (later also “Equipment”). A combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber. The electron beam should operate flexile from 0.5 kV to 30 kV with reasonable beam currents for analyses. The ion beam system should operate similarly in a flexible manner up to 30 kV and provide adequate resolution and milling rates for the materials, which are mainly steels. Automated ion milling software should be included with possibilities to perform 3D examinations and to pre-fabricate specimens for high-end techniques such as Atom Probe Tomography (APT) and Transmission Electron Microscopy (TEM). The FIB-SEM system should provide fast high-quality detectors for the techniques that are mostly applied: Energy Dispersive X-ray Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), and Electron Channeling Contrast Imaging (ECCI) investigations. The technical specification of the equipment and the tender process to be supplied was discussed in more detail in the invitation to tender documents.
Näytä lisää
Hankinnan kokonaisarvo: 1 392 000 EUR 💰
Ilmoituksen metatiedot
Asiakirjatyyppi: Ilmoitus tehdystä sopimuksesta

Menettely
Tarjouksen tyyppi: Ei sovelleta

Viite
Päivämäärät
Lähetyspäivä: 2023-02-23 📅
Julkaisupäivä: 2023-02-28 📅
Tunnisteet
Ilmoituksen numero: 2023/S 042-123919
Viittaa ilmoitukseen: 2022/S 197-558521
EUVL-S-numero: 42

Kohde
Hankinnan laajuus
Lyhyt kuvaus:
The object of the tender process was a combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber (later also “Equipment”).
Näytä lisää
The technical specification of the equipment and the tender process to be supplied was discussed in more detail in the invitation to tender documents.

Menettely
Myöntämisperusteet
Laatukriteeri (nimi): Technical features
Laatukriteeri (painotus): 40
Laatukriteeri (nimi): Delivery time
Laatukriteeri (painotus): 10
Hinta (painotus): 50

Sopimuksen tekeminen
Sopimuksen tekemispäivä: 2022-12-23 📅
Nimi: Finfocus Oy
Kansallinen rekisterinumero: 2102949-4
Postitoimipaikka: Helsinki
Maa: Suomi 🇫🇮
Manner-Suomi 🏙️
Hankinnan kokonaisarvo: 1 392 000 EUR 💰
Tietoa tarjouskilpailuista
Saatujen tarjousten määrä: 2
Lähde: OJS 2023/S 042-123919 (2023-02-23)
Uudet hankinnat asiaan liittyvissä luokissa 🆕
Aiheeseen liittyvät haut 🔍
Alue:
Suomi/Finland Manner-Suomi
Tuotteet/palvelut:
Laboratoriolaitteet, optiset ja... Testaus- ja koelaitteet Mikroskoopit Elektronimikroskoopit