Hankinnat: Elektronimikroskoopit
19 arkistoidut hankinnat
Elektronimikroskoopit ovat hankkineet esimerkiksi seuraavat organisaatiot Oulun yliopisto, University of Helsinki ja Aalto University Foundation.
Historiallisesti tämän alueen toimittajat ovat olleet Jeol (Skandinaviska) AB, JEOL (Nordic) AB, Carl Zeiss AB, Carl Zeiss Oy, Cheos Oy, FEI Europe B.V. Branch Office Denmark, FEI Europe B.V., Finfocus Oy ja JEOL Nordic AB.
- Laboratoriolaitteet, optiset ja tarkkuuslaitteet (lukuun ottamatta silmälaseja) (11 uudet hankinnat)
- Testaus- ja koelaitteet (1)
- Mikroskoopit (1)
- Elektronimikroskoopit ⬅️
Viimeaikaiset hankinnat elektronimikroskoopit osoitteessa Suomi
2025-04-01
Scanning Electron Microscope (Itä-Suomen yliopisto)
Instrument to be purchased is a Scanning Electron Microscope (SEM) for 200 mm standard wafer compatibility. An automated measurement over entire wafer is required. Also, EDS detector and 3D metrology are required. The instrument shall include standard back scattered electrons and secondary electrons detectors as well as cathodoluminescence detector. The SEM to be purchased will replace our current LEO 1550 used since 1997. Näytä hankinnat »
Instrument to be purchased is a Scanning Electron Microscope (SEM) for 200 mm standard wafer compatibility. An automated measurement over entire wafer is required. Also, EDS detector and 3D metrology are required. The instrument shall include standard back scattered electrons and secondary electrons detectors as well as cathodoluminescence detector. The SEM to be purchased will replace our current LEO 1550 used since 1997. Näytä hankinnat »
2025-03-11
Field emission scanning electron microscope (FESEM), Energy dispersive X-ray spectrometer for electron-excited x-ray... (University of Helsinki)
Field emission scanning electron microscope (FESEM), Energy dispersive X-ray spectrometer for electron-excited x-ray microanalysis (EDS) and Electron backscatter diffraction system/detector (EBSD) will be acquired for the Department of Chemistry, University of Helsinki. The instruments will have tens of users yearly. Most will be researchers within the department, but some users are from other units of the university, as well as from other universities, institutes, and companies. The users have varying … Näytä hankinnat »
Field emission scanning electron microscope (FESEM), Energy dispersive X-ray spectrometer for electron-excited x-ray microanalysis (EDS) and Electron backscatter diffraction system/detector (EBSD) will be acquired for the Department of Chemistry, University of Helsinki. The instruments will have tens of users yearly. Most will be researchers within the department, but some users are from other units of the university, as well as from other universities, institutes, and companies. The users have varying … Näytä hankinnat »
2024-10-15
120 keV Transmission Electron Microscope (Oulun yliopisto)
The procurement is about 120 keV Transmission electron microscope equipped with hardware and software for electron tomography. Equipment will be used in multi-user core facility to analyze mainly biological samples. The maximum total price of the offered system is 570 000 € (ecluding the VAT). Comparable properties affect the overall scoring of the tender. The procurement is funded by the Research Council of Finland, FIRI 2023: roadmap research infrastructures 2021–2024. Näytä hankinnat »
The procurement is about 120 keV Transmission electron microscope equipped with hardware and software for electron tomography. Equipment will be used in multi-user core facility to analyze mainly biological samples. The maximum total price of the offered system is 570 000 € (ecluding the VAT). Comparable properties affect the overall scoring of the tender. The procurement is funded by the Research Council of Finland, FIRI 2023: roadmap research infrastructures 2021–2024. Näytä hankinnat »
2023-01-23
Field Emission Scanning Electron Microscope (FE-SEM) (South-Eastern Finland University of Applied Sciences)
South-Eastern Finland University of Applied Sciences (Xamk) is purchasing a field emission scanning electron microscope (FE-SEM) with Energy Dispersive X-ray Spectrometer (EDS) according to this tender documentation. Equipment will be located to KymiLabs RDI-unit in Kotka. Pricing must include shipping costs to Kotka Finland (Pääskysentie 1, 48220 Kotka, Finland). Installation and user training must be included. Näytä hankinnat »
South-Eastern Finland University of Applied Sciences (Xamk) is purchasing a field emission scanning electron microscope (FE-SEM) with Energy Dispersive X-ray Spectrometer (EDS) according to this tender documentation. Equipment will be located to KymiLabs RDI-unit in Kotka. Pricing must include shipping costs to Kotka Finland (Pääskysentie 1, 48220 Kotka, Finland). Installation and user training must be included. Näytä hankinnat »
2022-10-07
A combined focused-ion beam / scanning electron microscope FIB-SEM (VTT Technical Research Centre of Finland Ltd)
The object of the tender process is a combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber (later also “Equipment”). A combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ … Näytä hankinnat »
The object of the tender process is a combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber (later also “Equipment”). A combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ … Näytä hankinnat »
2020-11-06
Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for Biological Specimens (University of Helsinki)
A high resolution field emission scanning electron microscope (SEM) equipped with a focused ion beam (FIB) for serial block face and section imaging of plastic embedded biological specimens. Näytä hankinnat »
A high resolution field emission scanning electron microscope (SEM) equipped with a focused ion beam (FIB) for serial block face and section imaging of plastic embedded biological specimens. Näytä hankinnat »
2018-10-19
Electron Probe Microanalyzer (EPMA) (Oulun yliopisto)
Center of Microscopy and Nanotechnology (CMNT) of the University of Oulu (hereafter called the Buyer) invites tenders for an electron probe microanalyzer (EPMA). The EPMA system will be mainly used in the analysis of geological and metallurgical samples. Detailed requirements for the EPMA are given in “APPENDIX 1, Mandatory Requirements for the EPMA System”. Evaluation criteria for the EPMA are given in “APPENDIX 2, Evaluation of the EPMA System”. Both documents are attached to this Call for Tenders. Näytä hankinnat »
Center of Microscopy and Nanotechnology (CMNT) of the University of Oulu (hereafter called the Buyer) invites tenders for an electron probe microanalyzer (EPMA). The EPMA system will be mainly used in the analysis of geological and metallurgical samples. Detailed requirements for the EPMA are given in “APPENDIX 1, Mandatory Requirements for the EPMA System”. Evaluation criteria for the EPMA are given in “APPENDIX 2, Evaluation of the EPMA System”. Both documents are attached to this Call for Tenders. Näytä hankinnat »
2018-07-12
Transmission electron microscope (TEM) equipped with a CMOS camera (University of Helsinki)
Transmission electron microscope (TEM) with accelerating voltage up to 120 kV equipped with a bottom-mounted CMOS camera, especially suitable for imaging of biological specimens. Näytä hankinnat »
Transmission electron microscope (TEM) with accelerating voltage up to 120 kV equipped with a bottom-mounted CMOS camera, especially suitable for imaging of biological specimens. Näytä hankinnat »
2017-12-13
Analytical (scanning) transmission electron micsocope ((S)TEM) + energy dispersive spectrometer (EDS) + electron... (TTY Foundation sr (Tampere University of Technology))
An analytical (scanning) transmission electron microscope ((S)TEM) equipped with an energy dispersive spectrometer (EDS) and electron energy loss spectrometer (EELS). The combined high-resolution TEM and STEM imaging with analysis systems (EDS and EELS) for chemical characterization. Näytä hankinnat »
An analytical (scanning) transmission electron microscope ((S)TEM) equipped with an energy dispersive spectrometer (EDS) and electron energy loss spectrometer (EELS). The combined high-resolution TEM and STEM imaging with analysis systems (EDS and EELS) for chemical characterization. Näytä hankinnat »
2015-12-21
Geologian tutkimuskeskus (in English: Geological Survey of Finland): invitation to tender for automated SEM-EDX... (Geologian tutkimuskeskus)
A quotation is requested for 1 (one) automated scanning electron microscope based mineral analyzer for mineral processing and geological samples together with relevant software and related services. Please see the invitation to tender for details. The invitation to tender and its appendices are available on GTK website http://www.gtk.fi/gtk/tarjouspyynnot Näytä hankinnat »
A quotation is requested for 1 (one) automated scanning electron microscope based mineral analyzer for mineral processing and geological samples together with relevant software and related services. Please see the invitation to tender for details. The invitation to tender and its appendices are available on GTK website http://www.gtk.fi/gtk/tarjouspyynnot Näytä hankinnat »
2015-05-07
Transmission Electron Microscope (TEM) (Oulun yliopisto)
The Center of Microscopy and Nanotechnology (CMNT) of the University of Oulu (hereafter called the Buyer) invites Suppliers to a competitive negotiated procedure related to a purchase of a new 200 kV transmission electron microscope (TEM). The TEM system will be mainly used in material research, for example, in analysis of metallurgical samples and nanoparticles. Besides conventional transmission electron microscopy the TEM system must also include scanning transmission electron microscope (STEM) … Näytä hankinnat »
The Center of Microscopy and Nanotechnology (CMNT) of the University of Oulu (hereafter called the Buyer) invites Suppliers to a competitive negotiated procedure related to a purchase of a new 200 kV transmission electron microscope (TEM). The TEM system will be mainly used in material research, for example, in analysis of metallurgical samples and nanoparticles. Besides conventional transmission electron microscopy the TEM system must also include scanning transmission electron microscope (STEM) … Näytä hankinnat »
2015-01-09
Transmission Electron Microscope (Aalto University Foundation)
Transmission Electron Microscope. See Invitation to Tender, available on request at registry@aalto.fi for further information. Please include the reference number D/479/01.01.04.00/2014 in the request message. Näytä hankinnat »
Transmission Electron Microscope. See Invitation to Tender, available on request at registry@aalto.fi for further information. Please include the reference number D/479/01.01.04.00/2014 in the request message. Näytä hankinnat »
2014-07-04
Pyyhkäisyelektronimikroskooppi, 1 kpl ja röntgenmikroanalysaattori, 1 kpl (Puolustusvoimat)
Puolustusvoimien tutkimuslaitos kilpailuttaa vuodelle 2014 — pos. 1: pyyhkäisyelektronimikroskoopin, 1 kpl, — pos. 2: röntgenmikroanalysaattorin, 1 kpl. Pyyhkäisyelektronimikroskooppia ja röntgenmikroanalysaattoria käytetään materiaalitutkimussovelluksiin. Tämä hankintailmoitus sisältää osallistumishakemuksen, joka on liitteenä. Näytä hankinnat »
Puolustusvoimien tutkimuslaitos kilpailuttaa vuodelle 2014 — pos. 1: pyyhkäisyelektronimikroskoopin, 1 kpl, — pos. 2: röntgenmikroanalysaattorin, 1 kpl. Pyyhkäisyelektronimikroskooppia ja röntgenmikroanalysaattoria käytetään materiaalitutkimussovelluksiin. Tämä hankintailmoitus sisältää osallistumishakemuksen, joka on liitteenä. Näytä hankinnat »
2014-06-27
Pyyhkäisyelektronimikroskooppi, 1 kpl ja röntgenmikroanalysaattori, 1 kpl (Puolustusvoimat)
Puolustusvoimien tutkimuslaitos kilpailuttaa vuodelle 2014 — pos. 1: pyyhkäisyelektronimikroskoopin, 1 kpl; — pos. 2: röntgenmikroanalysaattorin, 1 kpl; Pyyhkäisyelektronimikroskooppia ja röntgenmikroanalysaattoria käytetään materiaalitutkimussovelluksiin. Näytä hankinnat »
Puolustusvoimien tutkimuslaitos kilpailuttaa vuodelle 2014 — pos. 1: pyyhkäisyelektronimikroskoopin, 1 kpl; — pos. 2: röntgenmikroanalysaattorin, 1 kpl; Pyyhkäisyelektronimikroskooppia ja röntgenmikroanalysaattoria käytetään materiaalitutkimussovelluksiin. Näytä hankinnat »
2013-03-04
Analytical scanning electron microscope (Aalto University Foundation)
Analytical scanning electron microscope. See Invitation to Tender (available on request at registry@aalto.fi) for details. Näytä hankinnat »
Analytical scanning electron microscope. See Invitation to Tender (available on request at registry@aalto.fi) for details. Näytä hankinnat »
2012-05-09
Scanning electron microscope for electron beam lithography system (Aalto-korkeakoulusäätiö)
Thermal field emission scanning electron microscope for electron beam lithography system fully compatible with Nanometer Pattern Generation System from JC Nabity Lithography Systems (NGPS). Näytä hankinnat »
Thermal field emission scanning electron microscope for electron beam lithography system fully compatible with Nanometer Pattern Generation System from JC Nabity Lithography Systems (NGPS). Näytä hankinnat »
2012-04-17
Thermal field emission scanning electron microscope (VTT Technical Research Centre of Finland)
VTT requests a quotation in accordance with this invitation to tender from the thermal field emission scanning electron microscope. The main applications of the system will be failure research, investigation on microstrucures (especially grain boudaries), oxide layers, coatings and nano particles. Näytä hankinnat »
VTT requests a quotation in accordance with this invitation to tender from the thermal field emission scanning electron microscope. The main applications of the system will be failure research, investigation on microstrucures (especially grain boudaries), oxide layers, coatings and nano particles. Näytä hankinnat »
2011-04-12
Transmission electron microscope (120 kV) and camera purchase (University of Jyväskylä)
Purchase of the transmission electron microscope for the life science applications and camera. Näytä hankinnat »
Purchase of the transmission electron microscope for the life science applications and camera. Näytä hankinnat »
2010-05-08
Elektronimikroskoopit (Kemi-Tornionlaakson koulutuskuntayhtymä Lappia)
FE-SEM / Petri Ronkainen. Field Emission Scanning Electron Microscope with EDS. Hankinta kuuluu M-Lab/Hydro -projektiin, joka on Euroopan unionin osittain rahoittama materiaalien käyttevyyden tutkimuslaboratorion käynnistämiseen liittyvä hanke. Näytä hankinnat »
FE-SEM / Petri Ronkainen. Field Emission Scanning Electron Microscope with EDS. Hankinta kuuluu M-Lab/Hydro -projektiin, joka on Euroopan unionin osittain rahoittama materiaalien käyttevyyden tutkimuslaboratorion käynnistämiseen liittyvä hanke. Näytä hankinnat »