Viimeaikaiset hankinnat elektronimikroskoopit osoitteessa Suomi
2023-01-23Field Emission Scanning Electron Microscope (FE-SEM) (South-Eastern Finland University of Applied Sciences)
South-Eastern Finland University of Applied Sciences (Xamk) is purchasing a field emission scanning electron microscope (FE-SEM) with Energy Dispersive X-ray Spectrometer (EDS) according to this tender documentation. Equipment will be located to KymiLabs RDI-unit in Kotka.
Pricing must include shipping costs to Kotka Finland (Pääskysentie 1, 48220 Kotka, Finland). Installation and user training must be included.
Näytä hankinnat » Mainitut toimittajat:JEOL Nordic AB
2022-10-07A combined focused-ion beam / scanning electron microscope FIB-SEM (VTT Technical Research Centre of Finland Ltd)
The object of the tender process is a combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber (later also “Equipment”).
A combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ …
Näytä hankinnat » Mainitut toimittajat:Finfocus Oy
2018-10-19Electron Probe Microanalyzer (EPMA) (Oulun yliopisto)
Center of Microscopy and Nanotechnology (CMNT) of the University of Oulu (hereafter called the Buyer) invites tenders for an electron probe microanalyzer (EPMA). The EPMA system will be mainly used in the analysis of geological and metallurgical samples. Detailed requirements for the EPMA are given in “APPENDIX 1, Mandatory Requirements for the EPMA System”. Evaluation criteria for the EPMA are given in “APPENDIX 2, Evaluation of the EPMA System”. Both documents are attached to this Call for Tenders.
Näytä hankinnat » Mainitut toimittajat:JEOL (Nordic) AB
2015-05-07Transmission Electron Microscope (TEM) (Oulun yliopisto)
The Center of Microscopy and Nanotechnology (CMNT) of the University of Oulu (hereafter called the Buyer) invites Suppliers to a competitive negotiated procedure related to a purchase of a new 200 kV transmission electron microscope (TEM).
The TEM system will be mainly used in material research, for example, in analysis of metallurgical samples and nanoparticles. Besides conventional transmission electron microscopy the TEM system must also include scanning transmission electron microscope (STEM) …
Näytä hankinnat » Mainitut toimittajat:Jeol (Skandinaviska) AB
2014-07-04Pyyhkäisyelektronimikroskooppi, 1 kpl ja röntgenmikroanalysaattori, 1 kpl (Puolustusvoimat)
Puolustusvoimien tutkimuslaitos kilpailuttaa vuodelle 2014
— pos. 1: pyyhkäisyelektronimikroskoopin, 1 kpl,
— pos. 2: röntgenmikroanalysaattorin, 1 kpl.
Pyyhkäisyelektronimikroskooppia ja röntgenmikroanalysaattoria käytetään materiaalitutkimussovelluksiin.
Tämä hankintailmoitus sisältää osallistumishakemuksen, joka on liitteenä.
Näytä hankinnat »