2023-01-23   Field Emission Scanning Electron Microscope (FE-SEM) (South-Eastern Finland University of Applied Sciences)
South-Eastern Finland University of Applied Sciences (Xamk) is purchasing a field emission scanning electron microscope (FE-SEM) with Energy Dispersive X-ray Spectrometer (EDS) according to this tender documentation. Equipment will be located to KymiLabs RDI-unit in Kotka. Pricing must include shipping costs to Kotka Finland (Pääskysentie 1, 48220 Kotka, Finland). Installation and user training must be included. Näytä hankinnat »
Mainitut toimittajat: JEOL Nordic AB
2022-10-07   A combined focused-ion beam / scanning electron microscope FIB-SEM (VTT Technical Research Centre of Finland Ltd)
The object of the tender process is a combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber (later also “Equipment”). A combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ … Näytä hankinnat »
Mainitut toimittajat: Finfocus Oy
2020-11-06   Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for Biological Specimens (University of Helsinki)
A high resolution field emission scanning electron microscope (SEM) equipped with a focused ion beam (FIB) for serial block face and section imaging of plastic embedded biological specimens. Näytä hankinnat »
Mainitut toimittajat: Carl Zeiss Oy
2018-10-19   Electron Probe Microanalyzer (EPMA) (Oulun yliopisto)
Center of Microscopy and Nanotechnology (CMNT) of the University of Oulu (hereafter called the Buyer) invites tenders for an electron probe microanalyzer (EPMA). The EPMA system will be mainly used in the analysis of geological and metallurgical samples. Detailed requirements for the EPMA are given in “APPENDIX 1, Mandatory Requirements for the EPMA System”. Evaluation criteria for the EPMA are given in “APPENDIX 2, Evaluation of the EPMA System”. Both documents are attached to this Call for Tenders. Näytä hankinnat »
Mainitut toimittajat: JEOL (Nordic) AB
2018-07-12   Transmission electron microscope (TEM) equipped with a CMOS camera (University of Helsinki)
Transmission electron microscope (TEM) with accelerating voltage up to 120 kV equipped with a bottom-mounted CMOS camera, especially suitable for imaging of biological specimens. Näytä hankinnat »
2017-12-13   Analytical (scanning) transmission electron micsocope ((S)TEM) + energy dispersive spectrometer (EDS) + electron... (TTY Foundation sr (Tampere University of Technology))
An analytical (scanning) transmission electron microscope ((S)TEM) equipped with an energy dispersive spectrometer (EDS) and electron energy loss spectrometer (EELS). The combined high-resolution TEM and STEM imaging with analysis systems (EDS and EELS) for chemical characterization. Näytä hankinnat »
Mainitut toimittajat: JEOL (Nordic) AB
2015-12-21   Geologian tutkimuskeskus (in English: Geological Survey of Finland): invitation to tender for automated SEM-EDX... (Geologian tutkimuskeskus)
A quotation is requested for 1 (one) automated scanning electron microscope based mineral analyzer for mineral processing and geological samples together with relevant software and related services. Please see the invitation to tender for details. The invitation to tender and its appendices are available on GTK website http://www.gtk.fi/gtk/tarjouspyynnot Näytä hankinnat »
Mainitut toimittajat: FEI Europe B.V.
2015-05-07   Transmission Electron Microscope (TEM) (Oulun yliopisto)
The Center of Microscopy and Nanotechnology (CMNT) of the University of Oulu (hereafter called the Buyer) invites Suppliers to a competitive negotiated procedure related to a purchase of a new 200 kV transmission electron microscope (TEM). The TEM system will be mainly used in material research, for example, in analysis of metallurgical samples and nanoparticles. Besides conventional transmission electron microscopy the TEM system must also include scanning transmission electron microscope (STEM) … Näytä hankinnat »
Mainitut toimittajat: Jeol (Skandinaviska) AB
2015-01-09   Transmission Electron Microscope (Aalto University Foundation)
Transmission Electron Microscope. See Invitation to Tender, available on request at registry@aalto.fi for further information. Please include the reference number D/479/01.01.04.00/2014 in the request message. Näytä hankinnat »
Mainitut toimittajat: Jeol (Skandinaviska) AB
2014-07-04   Pyyhkäisyelektronimikroskooppi, 1 kpl ja röntgenmikroanalysaattori, 1 kpl (Puolustusvoimat)
Puolustusvoimien tutkimuslaitos kilpailuttaa vuodelle 2014 — pos. 1: pyyhkäisyelektronimikroskoopin, 1 kpl, — pos. 2: röntgenmikroanalysaattorin, 1 kpl. Pyyhkäisyelektronimikroskooppia ja röntgenmikroanalysaattoria käytetään materiaalitutkimussovelluksiin. Tämä hankintailmoitus sisältää osallistumishakemuksen, joka on liitteenä. Näytä hankinnat »
2014-06-27   Pyyhkäisyelektronimikroskooppi, 1 kpl ja röntgenmikroanalysaattori, 1 kpl (Puolustusvoimat)
Puolustusvoimien tutkimuslaitos kilpailuttaa vuodelle 2014 — pos. 1: pyyhkäisyelektronimikroskoopin, 1 kpl; — pos. 2: röntgenmikroanalysaattorin, 1 kpl; Pyyhkäisyelektronimikroskooppia ja röntgenmikroanalysaattoria käytetään materiaalitutkimussovelluksiin. Näytä hankinnat »
2013-03-04   Analytical scanning electron microscope (Aalto University Foundation)
Analytical scanning electron microscope. See Invitation to Tender (available on request at registry@aalto.fi) for details. Näytä hankinnat »
Mainitut toimittajat: FEI Europe B.V. Branch Office Denmark
2012-05-09   Scanning electron microscope for electron beam lithography system (Aalto-korkeakoulusäätiö)
Thermal field emission scanning electron microscope for electron beam lithography system fully compatible with Nanometer Pattern Generation System from JC Nabity Lithography Systems (NGPS). Näytä hankinnat »
Mainitut toimittajat: Jeol (Skandinaviska) AB
2012-04-17   Thermal field emission scanning electron microscope (VTT Technical Research Centre of Finland)
VTT requests a quotation in accordance with this invitation to tender from the thermal field emission scanning electron microscope. The main applications of the system will be failure research, investigation on microstrucures (especially grain boudaries), oxide layers, coatings and nano particles. Näytä hankinnat »
Mainitut toimittajat: Carl Zeiss AB
2011-04-12   Transmission electron microscope (120 kV) and camera purchase (University of Jyväskylä)
Purchase of the transmission electron microscope for the life science applications and camera. Näytä hankinnat »
Mainitut toimittajat: Cheos Oy Jeol (Skandinaviska) AB