The object of the tender process is a combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber (later also “Equipment”).
A combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber. The electron beam should operate flexile from 0.5 kV to 30 kV with reasonable beam currents for analyses. The ion beam system should operate similarly in a flexible manner up to 30 kV and provide adequate resolution and milling rates for the materials, which are mainly steels. Automated ion milling software should be included with possibilities to perform 3D examinations and to pre-fabricate specimens for high-end techniques such as Atom Probe Tomography (APT) and Transmission Electron Microscopy (TEM). The FIB-SEM system should provide fast high-quality detectors for the techniques that are mostly applied: Energy Dispersive X-ray Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), and Electron Channeling Contrast Imaging (ECCI) investigations.
The technical specification of the equipment and the tender process to be supplied is discussed in more detail in the invitation to tender documents.
Määräaika
Tarjousten vastaanottamisen määräaika oli 2022-11-11.
Hankinta julkaistiin 2022-10-07.
Toimittajat
Seuraavat toimittajat mainitaan hankintapäätöksissä tai muissa hankinta-asiakirjoissa:
Kohde Hankinnan laajuus
Otsikko:
“A combined focused-ion beam / scanning electron microscope FIB-SEM
Reg. No 49/206/2022”
Tuotteet/palvelut: Elektronimikroskoopit📦
Lyhyt kuvaus:
“The object of the tender process is a combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron...”
Lyhyt kuvaus
The object of the tender process is a combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber (later also “Equipment”).
A combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber. The electron beam should operate flexile from 0.5 kV to 30 kV with reasonable beam currents for analyses. The ion beam system should operate similarly in a flexible manner up to 30 kV and provide adequate resolution and milling rates for the materials, which are mainly steels. Automated ion milling software should be included with possibilities to perform 3D examinations and to pre-fabricate specimens for high-end techniques such as Atom Probe Tomography (APT) and Transmission Electron Microscopy (TEM). The FIB-SEM system should provide fast high-quality detectors for the techniques that are mostly applied: Energy Dispersive X-ray Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), and Electron Channeling Contrast Imaging (ECCI) investigations.
The technical specification of the equipment and the tender process to be supplied is discussed in more detail in the invitation to tender documents.
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Suorituspaikka: Manner-Suomi🏙️
Hankinnan kuvaus:
“The object of the tender process is a combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron...”
Hankinnan kuvaus
The object of the tender process is a combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber (later also “Equipment”).
A combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber. The electron beam should operate flexile from 0.5 kV to 30 kV with reasonable beam currents for analyses. The ion beam system should operate similarly in a flexible manner up to 30 kV and provide adequate resolution and milling rates for the materials, which are mainly steels. Automated ion milling software should be included with possibilities to perform 3D examinations and to pre-fabricate specimens for high-end techniques such as Atom Probe Tomography (APT) and Transmission Electron Microscopy (TEM). The FIB-SEM system should provide fast high-quality detectors for the techniques that are mostly applied: Energy Dispersive X-ray Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), and Electron Channeling Contrast Imaging (ECCI) investigations.
The technical specification of the equipment and the tender process to be supplied is discussed in more detail in the invitation to tender documents.
Näytä lisää Myöntämisperusteet
Hinta ei ole ainoa myöntämisperuste, ja kaikki perusteet ilmoitetaan ainoastaan hankinta-asiakirjoissa
Sopimuksen, puitesopimuksen tai dynaamisen hankintajärjestelmän kesto
Jäljempänä oleva aikataulu on ilmaistu kuukausina.
Kuvaus
Kesto: 12
Oikeudelliset, taloudelliset, rahoitukselliset ja tekniset tiedot Osallistumisehdot
Luettelo ja lyhyt kuvaus olosuhteista: As stated in the invitation to tender documents.
Taloudellinen ja rahoituksellinen asema
Luettelo ja lyhyt kuvaus valintaperusteista: Selection criteria as stated in the invitation to tender documents
Tekninen ja ammatillinen pätevyys
Luettelo ja lyhyt kuvaus valintaperusteista: Selection criteria as stated in the invitation to tender documents
Sopimukseen liittyvät ehdot
Sopimuksen täytäntöönpanoehdot: As stated in the invitation to tender documents.
Menettely Toimenpiteen tyyppi
Avoin menettely
Hallinnolliset tiedot
Tarjousten tai osallistumishakemusten vastaanottamisen määräaika: 2022-11-11
12:00 📅
Kielet, joilla tarjoukset tai osallistumishakemukset voidaan jättää: englanti 🗣️
Tarjouksen on oltava voimassa: 2023-02-28 📅
Tarjousten avaamista koskevat ehdot: 2022-11-11
12:30 📅
Tarjousten avaamista koskevat ehdot (Tiedot valtuutetuista henkilöistä ja avaamismenettelystä):
“The given date is preliminary. VTT reserves the right to change the scheduled date and time.
The opening of tenders shall not be a public event.”
Täydentävät tiedot Lisätietoja
“This notice has links and/or attachments listed in https://www.hankintailmoitukset.fi/en/public/procurement/76350/notice/110136” Arvostelurunko
Nimi: Markkinaoikeus
Postiosoite: Sörnäistenkatu 1
Postitoimipaikka: Helsinki
Postinumero: 00580
Maa: Suomi 🇫🇮
Puhelin: +358 295643300📞
Sähköposti: markkinaoikeus@oikeus.fi📧
URL: http://www.oikeus.fi/markkinaoikeus🌏
Lähde: OJS 2022/S 197-558521 (2022-10-07)
Ilmoitus tehdystä sopimuksesta (2023-02-23) Kohde Hankinnan laajuus
Otsikko: A combined focused-ion beam / scanning electron microscope FIB-SEM
Lyhyt kuvaus:
“The object of the tender process was a combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron...”
Lyhyt kuvaus
The object of the tender process was a combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber (later also “Equipment”).
A combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber. The electron beam should operate flexile from 0.5 kV to 30 kV with reasonable beam currents for analyses. The ion beam system should operate similarly in a flexible manner up to 30 kV and provide adequate resolution and milling rates for the materials, which are mainly steels. Automated ion milling software should be included with possibilities to perform 3D examinations and to pre-fabricate specimens for high-end techniques such as Atom Probe Tomography (APT) and Transmission Electron Microscopy (TEM). The FIB-SEM system should provide fast high-quality detectors for the techniques that are mostly applied: Energy Dispersive X-ray Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), and Electron Channeling Contrast Imaging (ECCI) investigations.
The technical specification of the equipment and the tender process to be supplied was discussed in more detail in the invitation to tender documents.
Näytä lisää
Hankinnan kokonaisarvo (ilman arvonlisäveroa): EUR 1 392 000 💰
Kuvaus
Hankinnan kuvaus:
“The object of the tender process was a combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron...”
Hankinnan kuvaus
The object of the tender process was a combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber (later also “Equipment”).
A combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber. The electron beam should operate flexile from 0.5 kV to 30 kV with reasonable beam currents for analyses. The ion beam system should operate similarly in a flexible manner up to 30 kV and provide adequate resolution and milling rates for the materials, which are mainly steels. Automated ion milling software should be included with possibilities to perform 3D examinations and to pre-fabricate specimens for high-end techniques such as Atom Probe Tomography (APT) and Transmission Electron Microscopy (TEM). The FIB-SEM system should provide fast high-quality detectors for the techniques that are mostly applied: Energy Dispersive X-ray Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), and Electron Channeling Contrast Imaging (ECCI) investigations.
The technical specification of the equipment and the tender process to be supplied was discussed in more detail in the invitation to tender documents.
Näytä lisää Myöntämisperusteet
Laatukriteeri (nimi): Technical features
Laatukriteeri (painotus): 40
Laatukriteeri (nimi): Delivery time
Laatukriteeri (painotus): 10
Hinta (painotus): 50
Menettely Hallinnolliset tiedot
Tätä menettelyä koskeva aiempi julkaisu: 2022/S 197-558521
Sopimuksen tekeminen
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Otsikko: A combined focused-ion beam / scanning electron microscope FIB-SEM
Sopimuksen tekopäivä: 2022-12-23 📅
Tietoa tarjouskilpailuista
Saatujen tarjousten määrä: 2
Pk-yrityksiltä saatujen tarjousten määrä: 1
Sähköisesti vastaanotettujen tarjousten määrä: 2
Toimeksisaajan nimi ja osoite
Nimi: Finfocus Oy
Kansallinen rekisterinumero: 2102949-4
Postitoimipaikka: Helsinki
Maa: Suomi 🇫🇮
Alue: Manner-Suomi🏙️
Toimeksisaaja on pk-yritys ✅ Tiedot sopimuksen/erän arvosta (ilman alv:tä)
Sopimuksen/osuuden kokonaisarvo: EUR 1 392 000 💰
Lähde: OJS 2023/S 042-123919 (2023-02-23)