FIBSEM

Määrä tai laajuus

The system must combine field emission scanning electron microscope (FE-SEM) and focused ion beam (FIB) columns.— It must be supplied complete with pumps and controllers including computers and software.— It should be clear from the specifications which software is necessary to run the instrument and which provides additional functionality.— Primary interest is on good base instrument (FIBSEM) but also various additional characterization equipment can be considered.— The specifications should also include description of integration of the optional equipment.— The optional equipment can be offered as a part of the instrument. Base instrument without options can also be quoted.More information is available in the Invitation of Tender documents available from tapio.k.niemi@tut.fi.

Lisätietoja

More information is available in the Invitation of Tender documents available from Tapio.K.Niemi@tut.fi

The customer will submit few samples for demonstration of the capabilities of the offered instrument. Tenderers must send an address, where the samples will be delivered, by 11.4.2014 to Tapio Niemi, tapio.k.niemi@tut.fi. The samples will be delivered as soon as possible after the address has been received. Preliminary measurement results should be attached to the tender.

Queries concerning the invitation to tender may be sent to Tapio Niemi, tapio.k.niemi@tut.fi. Queries must be sent via e-mail by 22.4.2014 at latest. Answers will be submitted to all tenderers by 30.4.2014. All tenderers must send an email address, to which the answers will be submitted, to Tapio Niemi, tapio.k.niemi@tut.fi, by 22.4.2014.

Binding tenders must be submitted in a sealed envelope on 16.5.2014 at 16:00 at the latest.

Address:

TUT Foundation (Tampere University of Technology)

Optoelectronics Research Centre

Anne Viherkoski

P.O. Box 692

FI-33101 Tampere, Finland

The following text must be written on the envelope: ‘Tender/FIBSEM’.