FIBSEM
A research system combining field emission scanning electron microcope (FE-SEM) and focused ion beam (FIB) materials processing unit for preparation of samples and processing and analysis of nanostructures and various materials.
The customer will submit few samples for demonstration of the capabilities of the offered instrument. The customer will visit on-site to evaluate user experience of the proposed instrument. More information is available in the Invitation of Tender documents available from
tapio.k.niemi@tut.fi.
Määräaika
Tarjousten vastaanottamisen määräaika oli 2014-05-16.
Hankinta julkaistiin 2014-03-31.
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Hankintojen historia
| Päivämäärä |
Asiakirja |
| 2014-03-31
|
hankintailmoitus
|