VTT is looking to semiautomatic probe station for measuring wafers up to 300mm, with heating and cooling capability. The object of the tender process is “Clean room compatible probe station for low current measurement for wafers up to 300 mm” (later also “Equipment”). The probe station’s primary use is room temperature semi-automated DC- and RF-characterisation (<20 GHz) of electrical components, that can be light sensitive, on single dies (5 mm x 5 mm), 150 mm, 200 mm, or 300 mm wafers. The equipment will be located in a clean room environment (ISO 6). The laboratory has vacuum, N2, and (clean dry air CDA) pressured air connections available. The object of the tender process is described in more detail in the invitation to tender documents.
Määräaika
Tarjousten vastaanottamisen määräaika oli 2023-03-29.
Hankinta julkaistiin 2023-02-23.
Toimittajat
Seuraavat toimittajat mainitaan hankintapäätöksissä tai muissa hankinta-asiakirjoissa:
hankintailmoitus (2023-02-23) Kohde Hankinnan laajuus
Otsikko: Teollisuuskoneet
Viitenumero: Reg. no 11/206/2023
Lyhyt kuvaus:
VTT is looking to semiautomatic probe station for measuring wafers up to 300mm, with heating and cooling capability.
The object of the tender process is “Clean room compatible probe station for low current measurement for wafers up to 300 mm” (later also “Equipment”). The probe station’s primary use is room temperature semi-automated DC- and RF-characterisation (<20 GHz) of electrical components, that can be light sensitive, on single dies (5 mm x 5 mm), 150 mm, 200 mm, or 300 mm wafers. The equipment will be located in a clean room environment (ISO 6). The laboratory has vacuum, N2, and (clean dry air CDA) pressured air connections available.
The object of the tender process is described in more detail in the invitation to tender documents.
VTT is looking to semiautomatic probe station for measuring wafers up to 300mm, with heating and cooling capability.
The object of the tender process is “Clean room compatible probe station for low current measurement for wafers up to 300 mm” (later also “Equipment”). The probe station’s primary use is room temperature semi-automated DC- and RF-characterisation (<20 GHz) of electrical components, that can be light sensitive, on single dies (5 mm x 5 mm), 150 mm, 200 mm, or 300 mm wafers. The equipment will be located in a clean room environment (ISO 6). The laboratory has vacuum, N2, and (clean dry air CDA) pressured air connections available.
The object of the tender process is described in more detail in the invitation to tender documents.
Ilmoituksen metatiedot
Alkukieli: englanti 🗣️
Asiakirjatyyppi: hankintailmoitus
Sopimuksen luonne: Tavarat
Asetus: Euroopan unioni ja WTO-maat
Yhteinen hankintanimikkeistö (CPV)
Koodi: Teollisuuskoneet📦 Suorituspaikka
NUTS-alue: Manner-Suomi
🏙️
Menettely
Menettelyn tyyppi: Avoin menettely
Tarjouksen tyyppi: Tarjous koskee kaikkia eriä
Myöntämisperusteet
Kokonaistaloudellisesti edullisin tarjous
The given date is preliminary. VTT reserves the right to change the scheduled date and time.
The opening of tenders shall not be a public event.
Kohde Hankinnan laajuus
Lyhyt kuvaus:
VTT is looking to semiautomatic probe station for measuring wafers up to 300mm, with heating and cooling capability.
The object of the tender process is “Clean room compatible probe station for low current measurement for wafers up to 300 mm” (later also “Equipment”). The probe station’s primary use is room temperature semi-automated DC- and RF-characterisation (<20 GHz) of electrical components, that can be light sensitive, on single dies (5 mm x 5 mm), 150 mm, 200 mm, or 300 mm wafers. The equipment will be located in a clean room environment (ISO 6). The laboratory has vacuum, N2, and (clean dry air CDA) pressured air connections available.
The object of the tender process is “Clean room compatible probe station for low current measurement for wafers up to 300 mm” (later also “Equipment”). The probe station’s primary use is room temperature semi-automated DC- and RF-characterisation (<20 GHz) of electrical components, that can be light sensitive, on single dies (5 mm x 5 mm), 150 mm, 200 mm, or 300 mm wafers. The equipment will be located in a clean room environment (ISO 6). The laboratory has vacuum, N2, and (clean dry air CDA) pressured air connections available.
The object of the tender process is described in more detail in the invitation to tender documents.
The objective is to find one professional supplier who can supply Equipment and installation and user training in its entirety. VTT
Technical Research Centre of Finland Ltd will choose one supplier from among the tenderers.
More technical details and specification of the equipment to be supplied is discussed in more detail in Annex 1.
Kesto: 18 kuukautta
Vaihtoehtojen kuvaus: The options have been described in the invitation to tender documents.
Oikeudelliset, taloudelliset, rahoitukselliset ja tekniset tiedot Osallistumisehdot
Kelpoisuus harjoittaa ammattitoimintaa: As stated in the invitation to tender documents.
Taloudellinen ja rahoituksellinen asema: Selection criteria as stated in the invitation to tender documents
Tekninen ja ammatillinen pätevyys: Selection criteria as stated in the invitation to tender documents
Sopimuksen toteuttaminen
Sopimuksen täytäntöönpanoehdot: As stated in the invitation to tender documents.
Menettely
Oikeusperusta: 32014L0024
Tarjousten vastaanottoaika: 12:00
Kielet, joilla tarjoukset tai osallistumishakemukset voidaan jättää: englanti 🗣️
Tarjouksen voimassaoloaika: 2023-08-31 📅
Tarjousten avauspäivä: 2023-03-29 📅
Tarjousten avausaika: 12:30
Lisätietoja:
The given date is preliminary. VTT reserves the right to change the scheduled date and time.
The opening of tenders shall not be a public event.
Täydentävät tiedot Arvostelurunko
Nimi: Markkinaoikeus
Postiosoite: Sörnäistenkatu 1
Postitoimipaikka: Helsinki
Postinumero: 00580
Maa: Suomi 🇫🇮
Puhelin: +358 295643300📞
Sähköposti: markkinaoikeus@oikeus.fi📧
Internetosoite: http://www.oikeus.fi/markkinaoikeus🌏
Lähde: OJS 2023/S 042-122176 (2023-02-23)
Ilmoitus tehdystä sopimuksesta (2023-09-06) Kohde Hankinnan laajuus
Viitenumero: Reg.no 11/206/2023
Lyhyt kuvaus:
VTT was looking to semiautomatic probe station for measuring wafers up to 300mm, with heating and cooling capability.
The object of the tender process was “Clean room compatible probe station for low current measurement for wafers up to 300 mm” (later also “Equipment”). The probe station’s primary use is room temperature semi-automated DC- and RF-characterisation (<20 GHz) of electrical components, that can be light sensitive, on single dies (5 mm x 5 mm), 150 mm, 200 mm, or 300 mm wafers. The equipment will be located in a clean room environment (ISO 6). The laboratory has vacuum, N2, and (clean dry air CDA) pressured air connections available.
The object of the tender process was described in more detail in the invitation to tender documents.
VTT was looking to semiautomatic probe station for measuring wafers up to 300mm, with heating and cooling capability.
The object of the tender process was “Clean room compatible probe station for low current measurement for wafers up to 300 mm” (later also “Equipment”). The probe station’s primary use is room temperature semi-automated DC- and RF-characterisation (<20 GHz) of electrical components, that can be light sensitive, on single dies (5 mm x 5 mm), 150 mm, 200 mm, or 300 mm wafers. The equipment will be located in a clean room environment (ISO 6). The laboratory has vacuum, N2, and (clean dry air CDA) pressured air connections available.
The object of the tender process was described in more detail in the invitation to tender documents.
VTT was looking to semiautomatic probe station for measuring wafers up to 300mm, with heating and cooling capability.
The object of the tender process was “Clean room compatible probe station for low current measurement for wafers up to 300 mm” (later also “Equipment”). The probe station’s primary use is room temperature semi-automated DC- and RF-characterisation (<20 GHz) of electrical components, that can be light sensitive, on single dies (5 mm x 5 mm), 150 mm, 200 mm, or 300 mm wafers. The equipment will be located in a clean room environment (ISO 6). The laboratory has vacuum, N2, and (clean dry air CDA) pressured air connections available.
The object of the tender process was “Clean room compatible probe station for low current measurement for wafers up to 300 mm” (later also “Equipment”). The probe station’s primary use is room temperature semi-automated DC- and RF-characterisation (<20 GHz) of electrical components, that can be light sensitive, on single dies (5 mm x 5 mm), 150 mm, 200 mm, or 300 mm wafers. The equipment will be located in a clean room environment (ISO 6). The laboratory has vacuum, N2, and (clean dry air CDA) pressured air connections available.
The object of the tender process was described in more detail in the invitation to tender documents.
The objective was to find one professional supplier who can supply Equipment and installation and user training in its entirety.
Menettely Myöntämisperusteet
Laatukriteeri (nimi): Technical features
Laatukriteeri (painotus): 35
Hinta (painotus): 65
Sopimuksen tekeminen
Sopimuksen tekemispäivä: 2023-05-29 📅
Nimi: Signal Solutions Nordic Oy
Kansallinen rekisterinumero: FI25289277
Postitoimipaikka: Espoo
Maa: Suomi 🇫🇮 Manner-Suomi
🏙️
Hankinnan kokonaisarvo: 339 587 EUR 💰
Tietoa tarjouskilpailuista
Saatujen tarjousten määrä: 2
Lähde: OJS 2023/S 174-546172 (2023-09-06)