Two electron detectors for transmission electron microscopes.
For further information, see separate documents (as attachment files at the Hanki / Tarjouspalvelu Service at https://www.hanki-palvelu.fi/en/).
Määräaika
Tarjousten vastaanottamisen määräaika oli 2022-06-06.
Hankinta julkaistiin 2022-05-03.
Toimittajat
Seuraavat toimittajat mainitaan hankintapäätöksissä tai muissa hankinta-asiakirjoissa:
Kohde Hankinnan laajuus
Otsikko:
“Two electron detectors for transmission electron microscopes
D/300/01.01.04.00/2022”
Tuotteet/palvelut: Laboratoriolaitteet, optiset ja tarkkuuslaitteet (lukuun ottamatta silmälaseja)📦
Lyhyt kuvaus:
“Two electron detectors for transmission electron microscopes.
For further information, see separate documents (as attachment files at the Hanki /...”
Lyhyt kuvaus
Two electron detectors for transmission electron microscopes.
For further information, see separate documents (as attachment files at the Hanki / Tarjouspalvelu Service at https://www.hanki-palvelu.fi/en/).
1️⃣
Suorituspaikka: Helsinki-Uusimaa🏙️
Hankinnan kuvaus:
“The main application for electron detectors is to facilitate transmission electron microscope (TEM) imaging. Aalto University is looking to purchase two...”
Hankinnan kuvaus
The main application for electron detectors is to facilitate transmission electron microscope (TEM) imaging. Aalto University is looking to purchase two electron detectors to enhance its imaging capabilities. The detectors are to be installed in the existing TEM instruments, preferably retaining the older CCD detectors (one in each TEM).
The first detector will be installed in the dedicated 300 kV cryoTEM (JEOL JEM-3200FSC). This detector should allow imaging under the extremely low dose conditions often employed with beam sensitive materials. The workflow used with block co-polymer sections relies heavily on live Fourier transform of the live image (live-FFT). The software must deliver live-FFT of sufficient quality to identify areas of interest in real time. However, the most sensitive block co-polymer sections are typically ruined at first exposure to the electron beam. Therefore, the detector should include a continuous image buffer of the live image so that at least the live frame can be salvaged. The detector must be able to perform single electron counting and dose fractionation. The detector will also be used for diffraction and EFTEM imaging where a linear acquisition mode will be useful. The microscope is also operated at lower voltages when necessary, therefore consistent detector performance across voltage ranges 100 kV to 300 kV is appreciated. This detector is required to fulfil a versatile use role with emphasis on detective quantum efficiency and high signal-to-noise ratio with low inherent noise.
The second detector will be installed in the analytical 200 kV TEM (JEOL JEM-2800). The user base of this microscope is highly varied and the microscope is used to study beam insensitive materials as well as beam sensitive materials. Aalto University wants to enhance the systems capabilities regarding beam sensitive materials and in-situ studies with a faster, more sensitive detector. This detector is not required to perform single electron counting. In addition to frame rate and sensitivity the detector must have a continuous image buffer.
For further information, see separate documents (as attachment files at the Hanki /
Tarjouspalvelu Service at https://www.hanki-palvelu.fi/en/).
Näytä lisää Myöntämisperusteet
Hinta
Kesto
Aloituspäivä: 2022-09-06 📅
Menettely Toimenpiteen tyyppi
Avoin menettely
Hallinnolliset tiedot
Tarjousten tai osallistumishakemusten vastaanottamisen määräaika: 2022-06-06
16:00 📅
Kielet, joilla tarjoukset tai osallistumishakemukset voidaan jättää: englanti 🗣️
Jäljempänä oleva aikataulu on ilmaistu kuukausina.
Vähimmäisaika, jonka kuluessa tarjoajan on pidettävä tarjous voimassa: 3
Tarjousten avaamista koskevat ehdot: 2022-06-06
16:05 📅
Täydentävät tiedot Arvostelurunko
Nimi: The Market Court
Postiosoite: Sörnäistenkatu 1
Postitoimipaikka: Helsinki
Postinumero: 00580
Maa: Suomi 🇫🇮
Puhelin: +358 295643300📞
Sähköposti: markkinaoikeus@oikeus.fi📧
URL: http://www.oikeus.fi/markkinaoikeus🌏
Lähde: OJS 2022/S 089-239897 (2022-05-03)
Ilmoitus tehdystä sopimuksesta (2022-07-29) Kohde Hankinnan laajuus
Lyhyt kuvaus: Two electron detectors for transmission electron microscopes.
Hankinnan kokonaisarvo (ilman arvonlisäveroa): EUR 669 530 💰
Kuvaus
Hankinnan kuvaus:
“The main application for electron detectors is to facilitate transmission electron microscope (TEM) imaging. Aalto University is looking to purchase two...”
Hankinnan kuvaus
The main application for electron detectors is to facilitate transmission electron microscope (TEM) imaging. Aalto University is looking to purchase two electron detectors to enhance its imaging capabilities. The detectors are to be installed in the existing TEM instruments, preferably retaining the older CCD detectors (one in each TEM).
The first detector will be installed in the dedicated 300 kV cryoTEM (JEOL JEM-3200FSC). This detector should allow imaging under the extremely low dose conditions often employed with beam sensitive materials. The workflow used with block co-polymer sections relies heavily on live Fourier transform of the live image (live-FFT). The software must deliver live-FFT of sufficient quality to identify areas of interest in real time. However, the most sensitive block co-polymer sections are typically ruined at first exposure to the electron beam. Therefore, the detector should include a continuous image buffer of the live image so that at least the live frame can be salvaged. The detector must be able to perform single electron counting and dose fractionation. The detector will also be used for diffraction and EFTEM imaging where a linear acquisition mode will be useful. The microscope is also operated at lower voltages when necessary, therefore consistent detector performance across voltage ranges 100 kV to 300 kV is appreciated. This detector is required to fulfil a versatile use role with emphasis on detective quantum efficiency and high signal-to-noise ratio with low inherent noise.
The second detector will be installed in the analytical 200 kV TEM (JEOL JEM-2800). The user base of this microscope is highly varied and the microscope is used to study beam insensitive materials as well as beam sensitive materials. Aalto University wants to enhance the systems capabilities regarding beam sensitive materials and in-situ studies with a faster, more sensitive detector. This detector is not required to perform single electron counting. In addition to frame rate and sensitivity the detector must have a continuous image buffer.