The instrument will be acquired for Chemistry Department, University of Helsinki. The aim is to study atomic layer deposition (and etching) process mechanisms. The system connects an ALD reactor to a UHV cluster containing at least XPS (X-ray photoelectron spectroscopy) and TPD (temperature programmed desorption) chambers, optionally also FTIR chamber. Samples can be transferred through loadlocks from the ALD reactor to the UHV cluster and back. Samples are not full wafers but smaller pieces which in the ALD reactor are placed on a wafer size carrier. The offer may cover: (i) the whole instrument; (ii) the ALD reactor only; or (iii) the UHV cluster with the analytical instruments. When offering only 1 part, the supplier needs to prepare ensuring proper interfacing between the ALD loadlock and the UHV loadlock to ensure a complete working system. Final designs for the interfacing are to be done at the negotiation phase of the procurement.
Määräaika
Tarjousten vastaanottamisen määräaika oli 2020-01-15.
Hankinta julkaistiin 2019-12-12.
Toimittajat
Seuraavat toimittajat mainitaan hankintapäätöksissä tai muissa hankinta-asiakirjoissa:
hankintailmoitus (2019-12-12) Kohde Hankinnan laajuus
Otsikko: Laboratoriolaitteet, optiset ja tarkkuuslaitteet (lukuun ottamatta silmälaseja)
Lyhyt kuvaus:
The instrument will be acquired for Chemistry Department, University of Helsinki. The aim is to study atomic layer deposition (and etching) process mechanisms. The system connects an ALD reactor to a UHV cluster containing at least XPS (X-ray photoelectron spectroscopy) and TPD (temperature programmed desorption) chambers, optionally also FTIR chamber. Samples can be transferred through loadlocks from the ALD reactor to the UHV cluster and back. Samples are not full wafers but smaller pieces which in the ALD reactor are placed on a wafer size carrier. The offer may cover:
(i) the whole instrument;
(ii) the ALD reactor only; or
(iii) the UHV cluster with the analytical instruments. When offering only 1 part, the supplier needs to prepare ensuring proper interfacing between the ALD loadlock and the UHV loadlock to ensure a complete working system. Final designs for the interfacing are to be done at the negotiation phase of the procurement.
The instrument will be acquired for Chemistry Department, University of Helsinki. The aim is to study atomic layer deposition (and etching) process mechanisms. The system connects an ALD reactor to a UHV cluster containing at least XPS (X-ray photoelectron spectroscopy) and TPD (temperature programmed desorption) chambers, optionally also FTIR chamber. Samples can be transferred through loadlocks from the ALD reactor to the UHV cluster and back. Samples are not full wafers but smaller pieces which in the ALD reactor are placed on a wafer size carrier. The offer may cover:
(i) the whole instrument;
(ii) the ALD reactor only; or
(iii) the UHV cluster with the analytical instruments. When offering only 1 part, the supplier needs to prepare ensuring proper interfacing between the ALD loadlock and the UHV loadlock to ensure a complete working system. Final designs for the interfacing are to be done at the negotiation phase of the procurement.
The instrument will be acquired for Chemistry Department, University of Helsinki. The aim is to study atomic layer deposition (and etching) process mechanisms. The system connects an ALD reactor to a UHV cluster containing at least XPS (X-ray photoelectron spectroscopy) and TPD (temperature programmed desorption) chambers, optionally also FTIR chamber. Samples can be transferred through loadlocks from the ALD reactor to the UHV cluster and back. Samples are not full wafers but smaller pieces which in the ALD reactor are placed on a wafer size carrier. The offer may cover:
The instrument will be acquired for Chemistry Department, University of Helsinki. The aim is to study atomic layer deposition (and etching) process mechanisms. The system connects an ALD reactor to a UHV cluster containing at least XPS (X-ray photoelectron spectroscopy) and TPD (temperature programmed desorption) chambers, optionally also FTIR chamber. Samples can be transferred through loadlocks from the ALD reactor to the UHV cluster and back. Samples are not full wafers but smaller pieces which in the ALD reactor are placed on a wafer size carrier. The offer may cover:
(i) the whole instrument;
(ii) the ALD reactor only; or
(iii) the UHV cluster with the analytical instruments. When offering only 1 part, the supplier needs to prepare ensuring proper interfacing between the ALD loadlock and the UHV loadlock to ensure a complete working system. Final designs for the interfacing are to be done at the negotiation phase of the procurement.
(iii) the UHV cluster with the analytical instruments. When offering only 1 part, the supplier needs to prepare ensuring proper interfacing between the ALD loadlock and the UHV loadlock to ensure a complete working system. Final designs for the interfacing are to be done at the negotiation phase of the procurement.
Osan nimi: ALD Reactor
Osan numero: 1
Lyhyt kuvaus:
The ALD reactor must be of a hot wall flow type reactor with a loadlock. Besides its normal operation, the loadlock must allow connection to the UHV cluster so that samples can be transferred to the UHV loadlock and further to the UHV cluster and analytical chambers. Samples are not full wafers but smaller pieces which in the ALD reactor are placed on a wafer size carrier. The reactor should have at least 2 solid (heated) sources, 2 liquid (non-heated) sources and at least 1 gas inlet. The reaction chamber must have an operation temperature of at least 450 ºC. The reactor must be compatible with metal halides and other common ALD precursors (exceptions should be mentioned). The substrate size must be 100 mm wafers in minimum. The reactor must have windows for connecting an ellipsometer (FilmSense, already owned by the buyer) on a loadlock in minimum, but if possible directly to the chamber. Plasma source must be offered as an option. Ozone generator can be offered as an option. QCM and/or QMS can also be offered as options, but their proper operation for representative reaction mechanism studies need to be demonstrated. Also other options like FTIR can be offered.
The ALD reactor must be of a hot wall flow type reactor with a loadlock. Besides its normal operation, the loadlock must allow connection to the UHV cluster so that samples can be transferred to the UHV loadlock and further to the UHV cluster and analytical chambers. Samples are not full wafers but smaller pieces which in the ALD reactor are placed on a wafer size carrier. The reactor should have at least 2 solid (heated) sources, 2 liquid (non-heated) sources and at least 1 gas inlet. The reaction chamber must have an operation temperature of at least 450 ºC. The reactor must be compatible with metal halides and other common ALD precursors (exceptions should be mentioned). The substrate size must be 100 mm wafers in minimum. The reactor must have windows for connecting an ellipsometer (FilmSense, already owned by the buyer) on a loadlock in minimum, but if possible directly to the chamber. Plasma source must be offered as an option. Ozone generator can be offered as an option. QCM and/or QMS can also be offered as options, but their proper operation for representative reaction mechanism studies need to be demonstrated. Also other options like FTIR can be offered.
Kesto: 12 kuukautta
Vaihtoehtojen kuvaus:
2 solid (heated) sources, 2 liquid (non-heated) sources, at least 1 gas inlet will be acquired. Additional sources as options. Plasma source must be offered as an option. Ozone generator can be offered as an option. QCM, QMS and/or FTIR can be offered as options, proper operation for representative reaction mechanism studies need to be demonstrated.
2 solid (heated) sources, 2 liquid (non-heated) sources, at least 1 gas inlet will be acquired. Additional sources as options. Plasma source must be offered as an option. Ozone generator can be offered as an option. QCM, QMS and/or FTIR can be offered as options, proper operation for representative reaction mechanism studies need to be demonstrated.
Osan nimi: UHV Cluster and Surface Analytical Instruments
Osan numero: 2
Lyhyt kuvaus:
UHV cluster must contain at least XPS (X-ray photoelectron spectroscopy) and TPD (temperature programmed desorption) instruments in separate chambers, optionally also a FTIR chamber. There must also be a distribution chamber(s) and system for transferring the samples between the analysis chambers and loadlocks. Samples are not full wafers but smaller pieces which in the ALD reactor are placed on a wafer size carrier from which they are picked for further transfer in the UHV cluster. One should also be able to return from the UHV side to the ALD reactor. There must also be a loadlock for a direct introduction of samples to the UHV cluster. XPS must be optimised for measuring chemical shifts: resolution and high count rate are emphasised. Sample holder should allow heating the sample up to at least 700 ºC. Ion beam gun for depth profiling and flood source for neutralising positive charging samples are also needed. Accessories to the XPS chamber should be offered; these may contain, but are not limited to, imaging XPS, ARXPS, ARPES, UPS, ISS, AES, EELS, LEED. TPD should have in minimum a mass spectrometer up to 300 amu and a port for gas inlet.
UHV cluster must contain at least XPS (X-ray photoelectron spectroscopy) and TPD (temperature programmed desorption) instruments in separate chambers, optionally also a FTIR chamber. There must also be a distribution chamber(s) and system for transferring the samples between the analysis chambers and loadlocks. Samples are not full wafers but smaller pieces which in the ALD reactor are placed on a wafer size carrier from which they are picked for further transfer in the UHV cluster. One should also be able to return from the UHV side to the ALD reactor. There must also be a loadlock for a direct introduction of samples to the UHV cluster. XPS must be optimised for measuring chemical shifts: resolution and high count rate are emphasised. Sample holder should allow heating the sample up to at least 700 ºC. Ion beam gun for depth profiling and flood source for neutralising positive charging samples are also needed. Accessories to the XPS chamber should be offered; these may contain, but are not limited to, imaging XPS, ARXPS, ARPES, UPS, ISS, AES, EELS, LEED. TPD should have in minimum a mass spectrometer up to 300 amu and a port for gas inlet.
Vaihtoehtojen kuvaus:
FTIR as a separate chamber can be offered as an option. Optional accessories to XPS chamber may contain, but are not limited to, imaging XPS, ARXPS, ARPES, UPS, ISS, AES, EELS, LEED. Properly sized UPS for uninterrupted power supply for at least 1 h backup as an option. Sample holders included and options for additional holders. Optional warranty years.
FTIR as a separate chamber can be offered as an option. Optional accessories to XPS chamber may contain, but are not limited to, imaging XPS, ARXPS, ARPES, UPS, ISS, AES, EELS, LEED. Properly sized UPS for uninterrupted power supply for at least 1 h backup as an option. Sample holders included and options for additional holders. Optional warranty years.
Menettely
Oikeusperusta: 32014L0024
Tarjousten vastaanottoaika: 12:00
Kielet, joilla tarjoukset tai osallistumishakemukset voidaan jättää: englanti 🗣️
Tarjouksen voimassaoloaika: 3 kuukautta
Ilmoitus tehdystä sopimuksesta (2020-06-22) Kohde Hankinnan laajuus
Lyhyt kuvaus:
Vacuum cluster connecting an ALD reactor to surface analytical instrument for Chemistry department, University of Helsinki.
The aim is to study atomic layer deposition (and etching) process mechanisms. The system connects an ALD reactor to a UHV cluster containing at least XPS (X-ray photoelectron spectroscopy) and TPD (temperature programmed desorption) chambers, optionally also FTIR chamber. Samples can be transferred through loadlocks from the ALD reactor to the UHV cluster and back. Samples are not full wafers but smaller pieces which in the ALD reactor are placed on a wafer size carrier.
Vacuum cluster connecting an ALD reactor to surface analytical instrument for Chemistry department, University of Helsinki.
The aim is to study atomic layer deposition (and etching) process mechanisms. The system connects an ALD reactor to a UHV cluster containing at least XPS (X-ray photoelectron spectroscopy) and TPD (temperature programmed desorption) chambers, optionally also FTIR chamber. Samples can be transferred through loadlocks from the ALD reactor to the UHV cluster and back. Samples are not full wafers but smaller pieces which in the ALD reactor are placed on a wafer size carrier.
Vacuum cluster connecting an ALD reactor to surface analytical instrument for Chemistry department, University of Helsinki.
The aim is to study atomic layer deposition (and etching) process mechanisms. The system connects an ALD reactor to a UHV cluster containing at least XPS (X-ray photoelectron spectroscopy) and TPD (temperature programmed desorption) chambers, optionally also FTIR chamber. Samples can be transferred through loadlocks from the ALD reactor to the UHV cluster and back. Samples are not full wafers but smaller pieces which in the ALD reactor are placed on a wafer size carrier.
The aim is to study atomic layer deposition (and etching) process mechanisms. The system connects an ALD reactor to a UHV cluster containing at least XPS (X-ray photoelectron spectroscopy) and TPD (temperature programmed desorption) chambers, optionally also FTIR chamber. Samples can be transferred through loadlocks from the ALD reactor to the UHV cluster and back. Samples are not full wafers but smaller pieces which in the ALD reactor are placed on a wafer size carrier.
The ALD reactor must be of a hot wall flow type reactor with a loadlock. Besides its normal operation, the loadlock must allow connection to the UHV cluster so that samples can be transferred to the UHV loadlock and further to the UHV cluster and analytical chambers. Samples are not full wafers but smaller pieces which in the ALD reactor are placed on a wafer size carrier.
The ALD reactor must be of a hot wall flow type reactor with a loadlock. Besides its normal operation, the loadlock must allow connection to the UHV cluster so that samples can be transferred to the UHV loadlock and further to the UHV cluster and analytical chambers. Samples are not full wafers but smaller pieces which in the ALD reactor are placed on a wafer size carrier.
The reactor should have at least 2 solid (heated) sources, 2 liquid (non-heated) sources, and at least one gas inlet. The reaction chamber must have an operation temperature of at least 450°C. The reactor must be compatible with metal halides and other common ALD precursors (exceptions should be mentioned). The substrate size must be 100 mm wafers in minimum.
The reactor should have at least 2 solid (heated) sources, 2 liquid (non-heated) sources, and at least one gas inlet. The reaction chamber must have an operation temperature of at least 450°C. The reactor must be compatible with metal halides and other common ALD precursors (exceptions should be mentioned). The substrate size must be 100 mm wafers in minimum.
The reactor must have windows for connecting an ellipsometer (FilmSense, already owned by the buyer) on a loadlock in minimum, but if possible directly to the chamber.
Plasma source must be offered as an option. Ozone generator can be offered as an option.
QCM and/or QMS can also be offered as options, but their proper operation for representative reaction mechanism studies need to be demonstrated. Also other options like FTIR can be offered.
Vaihtoehtojen kuvaus:
2 solid (heated) sources, 2 liquid (non-heated) sources, at least one gas inlet will be acquired. Additional sources as options.
Plasma source must be offered as an option.
Ozone generator can be offered as an option.
QCM, QMS and/or FTIR can be offered as options, proper operation for representative reaction mechanism studies need to be demonstrated.
Lyhyt kuvaus:
UHV cluster must contain at least XPS (X-ray photoelectron spectroscopy) and TPD (temperature programmed desorption) instruments in separate chambers, optionally also a FTIR chamber. There must also be a distribution chamber(s) and system for transferring the samples between the analysis chambers and loadlocks. Samples are not full wafers but smaller pieces which in the ALD reactor are placed on a wafer size carrier from which they are picked for further transfer in the UHV cluster. One should also be able to return from the UHV side to the ALD reactor. There must also be a loadlock for a direct introduction of samples to the UHV cluster.
UHV cluster must contain at least XPS (X-ray photoelectron spectroscopy) and TPD (temperature programmed desorption) instruments in separate chambers, optionally also a FTIR chamber. There must also be a distribution chamber(s) and system for transferring the samples between the analysis chambers and loadlocks. Samples are not full wafers but smaller pieces which in the ALD reactor are placed on a wafer size carrier from which they are picked for further transfer in the UHV cluster. One should also be able to return from the UHV side to the ALD reactor. There must also be a loadlock for a direct introduction of samples to the UHV cluster.
XPS must be optimised for measuring chemical shifts: resolution and high count rate are emphasised. Sample holder should allow heating the sample up to at least 700°C. Ion beam gun for depth profiling and flood source for neutralising positive charging samples are also needed. Accessories to the XPS chamber should be offered; these may contain, but are not limited to, imaging XPS, ARXPS, ARPES, UPS, ISS, AES, EELS, LEED.
XPS must be optimised for measuring chemical shifts: resolution and high count rate are emphasised. Sample holder should allow heating the sample up to at least 700°C. Ion beam gun for depth profiling and flood source for neutralising positive charging samples are also needed. Accessories to the XPS chamber should be offered; these may contain, but are not limited to, imaging XPS, ARXPS, ARPES, UPS, ISS, AES, EELS, LEED.
TPD should have in minimum a mass spectrometer up to 300 amu and a port for gas inlet.
Vaihtoehtojen kuvaus:
FTIR as a separate chamber can be offered as an option.
Optional accessories to XPS chamber may contain, but are not limited to, imaging XPS, ARXPS, ARPES, UPS, ISS, AES, EELS, LEED.
Properly sized UPS for uninterrupted power supply for at least 1 h backup as an option.
Sample holders included and options for additional holders.
Optional warranty years.
Menettely Myöntämisperusteet
Laatukriteeri (nimi): Quality
Laatukriteeri (painotus): 45
Hinta (painotus): 55
Laatukriteeri (painotus): 40
Hinta (painotus): 60
Sopimuksen tekeminen
Sopimuksen tekemispäivä: 2020-06-10 📅
Nimi: Beneq Oy
Kansallinen rekisterinumero: FI19563372
Postiosoite: Olarinluoma 9
Postitoimipaikka: Espoo
Postinumero: 02200
Maa: Suomi 🇫🇮
Puhelin: +358 447097412📞
Sähköposti: kari.koski@beneq.com📧
Maa: Helsinki-Uusimaa
🏙️
Hankinnan kokonaisarvo: 382 100 EUR 💰
Sopimuksen tekemispäivä: 2020-05-29 📅
Nimi: PREVAC sp. z o.o.
Kansallinen rekisterinumero: PL6471782175
Postiosoite: ul. Raciborska 61
Postitoimipaikka: Rogów
Postinumero: 44362
Maa: Puola 🇵🇱
Puhelin: +48 324592000📞
Sähköposti: tenders@prevac.pl📧
Hankinnan kokonaisarvo: 794 860 EUR 💰
Tietoa tarjouskilpailuista
Saatujen tarjousten määrä: 2
1
Lähde: OJS 2020/S 121-295087 (2020-06-22)